Showing results: 151 - 165 of 171 items found.
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Sensors, Inc.
Accurate measurement of gases and their concentrations is critical in many applications, and often poses a major challenge. Sensors' experience with different measurement principles, including NDIR, NDUV, and thermal conductivity, along with the ability to provide special combinations of these techniques within our products, enables us to tackle these challenges. In addition, our experience goes into every detail of our gas analyzers, ensuring reliable results, even under harsh conditions. Our skilled team of experts is happy to assist you in finding the optimized solution for your measurement requirements, with either off-the-shelf components or a customized solution.
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ST2839 -
Saluki Technology Inc.
ST2839 series precision impedance analyzer is a new generation impedance test instrument by adopting the current international advanced automatic balance bridge principle. Its basic accuracy of 0.05%, the fastest test speed of 5.6ms, the frequency range of 20Hz-10MHz, and the impedance test range of up to 1GΩ can meet the testing requirements of components and materials, especially for low-loss (D) capacitors and high-quality Measurement of Factor (Q) Inductors. The four-terminal pair port configuration method can effectively eliminate the influence of the electromagnetic coupling of the test line, and expand the lower limit of the low-impedance test capability ten times lower than that of the conventional five-terminal configuration instrument.
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DZV-1 -
Digital Signal Technology, Inc.
DZV-1 is the vector network analyzer which can be measured the impedance and VSWR of the antenna, S Parameter of RF component and devices. It is small and low-priced. So, it is suitable for the production line, laboratory use, various testing applications, and the educational use. The communication between the DZV-1 unit and PC is done via USB, which is also used for power supply. The LOG-MAG characteristic, the phase-characteristic, the group delay frequency characteristics, the Smith chart, the polar coordinates, the SWR characteristic can be displayed on PC.
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E5263A -
Keysight Technologies
Keysight E5262A and E5263A 2ch IV Analyzers are the low cost solution for current-voltage characterization. The E5262A and E5263A support two channels of SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 5 pA. The Easy EXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU's versatile measurement capabilities and GUI based characterization software makes the E5262A and E5263A the best solutions for characterization and evaluation of two or three terminal devices such as materials and active/passive components with uncompromised measurement reliability and efficiency.
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M8290A -
Keysight Technologies
The M8290A is a flexible solution platform for 400G coherent component and transmitter test. It incorporates a 92 GSa/s modular optical modulation analyzer and a 92 GSa/s 4-channel electrical digitizer. Besides these modules an additional arbitrary waveform generator module up to 92 GSa/s, such as the M8196A, can be added to the same AXIe chassis. This setup results in a compact and flexible coherent test solution that can be used together with additional specialized solution software for Integrated Coherent Receiver (ICR) and Analog Coherent Optical (ACO) module characterization.
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2440 -
Photon Kinetics
The 2440 Launch Analyzer is the first fully automated test system for characterizing the optical power distribution of the light produced by VCSEL laser sources, multimode fiber test equipment and launch cords utilized in multimode fiber links. Built on over 20 years of experience testing the transmission and geometric properties of muitimode fibers, the 2440 is the ideal solution for ensuring that source launches comply with applicable international component specifications and measurement standards. The 2440 can be configured for measurements in either or both the 850 and 1300 nm windows.
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E5270B -
Keysight Technologies
Keysight E5270B Precision IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices. The E5270B supports multiple SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 0.1 fA. Its modular architecture allows you to configure or upgrade SMU modules for available eight slots. The EasyEXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU's versatile measurement capabilities and GUI based characterization software makes the E5270B the best solution for characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency.
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E5260A -
Keysight Technologies
Keysight E5260A IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices. The E5260A supports multiple SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 5 pA. Its modular architecture allows you to configure or upgrade SMU modules for available eight slots. The EasyEXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU’s versatile measurement capabilities and GUI based characterization software makes the E5260A the best solution for characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency.
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LF1 set -
Langer EMV-Technik GmbH
The LF1 near-field probe set consists of 4 shielded near-field probes used during the development process for emission measurement of longwave, medium wave, and shortwave frequencies on electronic devices. The probe heads of the LF1 set are designed for incremental detection of sources of electromagnetic interference on assemblies. First, the electromagnetic interference of the assembly is detected by the LF-R 400 probe from up to 10 cm. Then probes with higher resolution like the LF-B 3, LF-U 5 and LF-U 2.5 are used to more precisely detect any source of interference. The probe heads are designed for taking measurements at single pins and larger components. Near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probes do not have an internal terminating resistance of 50 Ω.
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MEXA-ONE-FT -
HORIBA, Ltd.
The MEXA-ONE-FT Series simultaneously measures concentrations of multiple components, including NH3, N2O, CH4, CO and CO2, in undiluted exhaust gas using the Fourier transform infrared (FTIR) method in combination with a multivariate analysis algorithm. It incorporates HORIBA's proprietary compact interferometer which yields superior performance and high accuracy.The system complies with NH3 testing requirements of Euro VI, the EU regulation for heavy duty emissions testing.The MEXA-ONE-FT can be calibrated according to customer requirements with up to 6 component sets to cover a wide range of applications.FTIR spectroscopy allows the direct measurement of NO2 emissions and the independent quantification of individual hydrocarbon species. This makes the MEXA-ONE-FT system an ideal solution for detailed research and development tasks.Due to the measurement principle, the time-consuming daily span gas calibration is omitted.In addition, usability and flexibility are realized by “HORIBA ONE PLATFORM” which enables to extend the system with other ONE analyzers to a complete solution suitable for both certification and R&D purposes.
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PCA-400 -
Bacharach, Inc.
Bacharach’s active sample conditioner is used to enhance the performance of the PCA® 400 combustion and emissions analyzer in heavy industrial and commercial settings. The PCA® 400 provides accurate readings for CO, O2 and NO with a standard probe. Bacharach also offers optional Viton™ tubing with the sample conditioner to eliminate sample dropout, ensuring accurate results in applications where NO2 and SO2 measurements are necessary. The sample conditioner removes water vapor from the stack gas sample, preventing the formation of water droplets inside the analyzer’s probe hose. Water in the sample hose could absorb a portion of the gas sample and result in lower than actual readings of NO2 and SO2. The water extracted from the gas sample is pulled out of the thermoelectric (Peltier) cooler and into a water catch pot. The dry, conditioned flue-gas sample is then passed through to the PCA® 400 for analysis, ensuring a clean, dry, accurate air sample. This also prevents water passing into the instrument and possibly damaging the sensors or other components.
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SX set -
Langer EMV-Technik GmbH
The SX1 set consists of 3 passive near field probes for making measurements in the development phase of E-field and magnetic field with a high clock frequency in the range from 1 GHz to 10 GHz. The probe heads of the set SX allow for measurements close to electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors, to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through trained use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
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280 Series -
Teledyne LeCroy quantumdata
The Teledyne LeCroy quantumdata 280 HDMI/HDBaseT Video Generator (Tx) and Analyzer (Rx) is small compact, battery powered test set ideally suited for professional A/V integrators and home theatre installers. This convenient test set enables you to conduct basic verification and diagnostic tests on HDMI/HDBaseT cables, video distribution networks and individual A/V components. The HDMI input and output ports support testing up to 18 Gbps data rate and 600 MHz pixel rate and the HDBaseT input and output ports support testing up to 300 MHz pixel rate. The HDBaseT interface supports transmission in Long Reach mode as well.
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RF1 set -
Langer EMV-Technik GmbH
The RF1 near field probe set consists of 4 passive near field probes for making measurements in the development phase of E-field and magnetic field in the ranges of 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF1 set allow for measurements close to the electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors in order to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Fideris
* Fully programmable, self-contained, air-cooled solid state load.* Patented design is optimized to provide ultra-low impedance operation for fuel cell testing.* Load is compatible with AC impedance or frequency response analyzers.* Interchangeable shunts for precise operation over a wide dynamic range.* Ten built-in cell voltage monitoring inputs optional. Additional voltage monitoring inputs available.* Ethernet Interface for simple configuration and expansion!* Combine with additional Fideris™ Innovator Series™ modules to create a fully-integrated,fully-automated, customized test system.* System-wide control of all Fideris™ Test System Components using FCPower™ Software,LabviewTM, or other programming language.* Integrated hardwired Run/Standby signal.
